AFM Calculated Parameters of Morphology Investigation of Spin Coated MZO (M = Al, Sn, Cd, Co) Layers
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Date
2015
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Sumy State University
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Abstract
This paper reports on the deposition and surface properties of the pure and doped zinc oxide layers
produced by spin coating route. Pure and metallic (Al, Sn, Cd, Co) doped ZnO films are characterized by
mean of atomic force microscopy (AFM). Based on atomic force microscope observation, some parameters
such as grain size, height, orientation of angle and histogram are determined. The AFM scanned 2D and
3D-views permit us to discover the roughness, the average height and the skewness of clusters or grains.
Keywords
Spin coating, ZnO layer, Metallic dopant, A tomic force microscope, Grain size, Roughness, Histogram
Citation
Benhaliliba, M. AFM Calculated Parameters of Morphology Investigation of Spin Coated MZO (M = Al, Sn, Cd, Co) [Текст] / M. Benhaliliba, A. Tiburcio-Silver, A. Avila-Garcia // Журнал нано- та електронної фізики. — 2015. — Т.7, №4. — 04012-1.